This system includes three X-ray diffractometers: a pole figure diffractometer, a high-resolution X-ray diffractometer, and a powder diffractometer. The pole figure diffractometer uses a cobalt target and is equipped with a capillary for parallel and focused beams, suitable for pole figure measurement of steel, non-ferrous metals, ceramics, and minerals. The high-resolution X-ray diffractometer uses a copper target and is equipped with a focusing lens and a single crystal diffractometer, capable of general diffraction analysis, low-angle diffraction analysis, high-resolution epitaxial film diffraction analysis, and X-ray reflectivity measurement. The powder diffractometer uses a copper target and is equipped with a 192-channel high-resolution detector and a θ-θ angle measurement device for structure analysis of horizontally placed polycrystalline blocks and powder materials.

Equipment Description

• Pole figure X-ray diffractometer (Bruker D8-Discover)：Cobalt target, point light source, capillary lens (parallel light, focused light beam and microscopic light beam)
• High-resolution X-ray diffractometer (Bruker D8-Discover)：Copper target, line light source, focusing lens, Ge(220) asymmetric monophotometer, secondary side variable slit grating and triaxial crystal
• Powder X-ray diffractometer (Bruker D2-Phaser)：Copper target, line light source, equipped with 192-channel high-resolution detector

Service Items

• Pole figure measurement and analysis
• Crystal orientation distribution function calculation
• X-ray diffraction of ω-2θ，ω，2θ，Phi，Chi
• Grazing incidence X-Ray Diffraction
• High Resolution X-Ray Diffraction
• X-Ray Reflectometry measurement and analysis
• Diffraction analysis of polycrystalline bulk and powder materials

Preparation of specimens

• Pole figure analysis：2 cm*2 cm*0.5 cm (please contact the technician for other sizes)
• GID / rocking curve / XRR / HR-XRD：smallest size 1 cm*1 cm
• Specimen state: solid state bulk with flat / polished surface
• Materials: without toxic chemicals

Charge

1.  Pole Figure Measurement, High Resolution Epitaxial Diffraction (HR-XRD), X-ray Low Grazing Angle Diffraction (GID), Rocking Curve: $600 per piece/30 minutes, accumulated over time.
2.  Calculation of crystallographic orientation distribution function (ODF): additional $1,000 per group.
3.  X-ray reflectivity (XRR): $600 per piece/30 minutes, accumulated over time. For thickness simulation, an additional $500 will be charged for each group.
4.  General diffraction analysis (powder, block): $600 per piece/30 minutes , accumulated over time.
5.  General diffraction analysis phase identification is $600 per piece.

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