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Field-Emission Scanning Electron Microscope

The field emission scanning electron microscope (SEM) uses negative pressure applied to a metal tip to extract electrons from the tip and generate a very small electron beam. Operating in ultra-high vacuum (-10-10 torr), it can produce high-quality resolution images. With the development of science and technology, nanoscience and nanotechnology have become the mainstay of national high-tech development. They can meet the requirements of smaller and finer components, control the material composition, interface structure, and manipulate them within 1-100 nanometers. Observing the resulting changes in physical, chemical, and biological properties can be applied to industry. The FE-SEM provides the most important tool for measuring and manipulating these nanostructures.

Equipment Description

Model:JEOL JSM-6330TF

Resolution 1.5nm(15kv), 5.0nm(1.0kv)
Acceleration 0.5kv to 30kv (100v steps)
Magnification x10 to x500,000
GUN Thermal field effect type In-Lens Thermal
Image mode

SEI(Secondary Electron Image)

BEI TOPO/COMP(Back Electronic Image)

Maximum allowable sample 25mm diameter x 10mm height
Live image display 1280x1024 pixels
Specimen stage

Eccentric

X=70mm, Y=50mm, Z=3mm~41mm

R=360°,T=-5~60°

  • CL (Cathodoluminescence System) Cathodoluminescence Detection System

Service Items

  • SEI(Scanning Electron Image)material surface structure observation, broken surface observation, thin film coating observation
  • BEI(Backscatter Electron Image)backscattered electron image observation
  • Energy Dispersive Spectrometer can be used for qualitative, semi-quantitative analysis of micro-region components, linescan and mapping

Sampling Precautions

  • For SEI, BEI and CL parts: the size and diameter of the specimens should be within 25mm, and the height should not exceed 10mm. Please pre-process the test piece by yourself.
  • The surface of the sample needs to be conductive, and the sample with a non-conductive surface needs to be carbon-plated or gold-plated, please handle it yourself first. If there is no prior processing, there is also on-site, but an additional cash fee is required (NT$200 per time)
  • Please bring your own CD to access the files, it is forbidden to access files with flash drives.
  • Cancellation notice is required 2 days in advance, otherwise a penalty may be imposed. The basic usage fee will still be charged, and the appointment will be given to the next person on the waiting list.
  • Toxic, corrosive, volatile, magnetic, or low melting point materials are prohibited.
  • Please contact the technician by phone in advance for the preparation method of nano powder.
  • Please fill out the 'Polymer Application Form' for polymer materials. After review and approval, you may proceed to make a reservation.

Charges

Project

Non-project

Training

 Certified 

 Fee Description

 Self-operated 

 Entrust 

 Self-operated 

 Entrust 

Fee

 Time 

200

300

1500

 300/HR 

6

1000

Hourly billing

 A session is 3 hours 

Less than 1 hour will be charged as 1 hour

Additional use:

  • An additional NT$50/point is charged for point analysis of the EDS system
  • An additional NT$100/point is charged for surface and line analysis
  • Additional NT$150 per hour for CL system

Contact Detail

Instrument expert: Prof. Yeo-Wan Chiang
Technical staff: Tsai-Jung Yen
contact method: (07)5252000 ext. 4085 judyyen123@staff.nsysu.edu.tw
Place: Materials Building 3F, Room MS3024
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