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JEOL JEM-2100 Electron Microscope

This is a description of a specialized analysis method for soft materials such as polymer materials, organic materials, organic/inorganic composite materials, biological materials, and thin film samples. A 200KV high-energy transmission sample is used to observe the morphology and shape of soft materials, measure dimensions, analyze the fine structure, defects, and crystal structure inside the material. The method also provides high-angle multi-directional morphology observation, diffraction analysis, and bright/dark field imaging at the same time.

Equipment Description

  • Model:JEOL JEM-2100 Transmission Electron Microscope

  • Specifications:
  1. Acceleration voltage:0~200KV
  2. Magnification:50~1,200,000X
  3. Resolution:Point : 0.25nm; Lattice : 0.14nm
  4.  Spot size : 1.5~200nm
  5.  Specimen Tilt Angle: X≧±40°, Y≧±30°

  • Attachment:
  1. CCD camera system(2672 x 2672 pixel)
  2. High tilting stage: X≧±70°
  3. Energy Dispersive Spectrometer: Oxford X-MAX 80T

Function and usage

  1.  Soft-material microstructure analysis
  2.  Diffraction
  3.  EDS: Detection range : Be(4) to Am(95)

Service Items

  • Soft Matter Morphology Observation Analysis and Diffraction Analysis

Charges

  1.  Filament use time per period (in three hours)
  • Project: NT$1,800
  • Self-operated: NT$600
  • Non-Project: NT$6,000
  1.  Vacuum evaporation or metal projection: NT$3000 each time
  2.  Dyeing: NT$1,000 per piece
  3.  Negative photography: NT$3,000 per photo
  4.  Elemental analysis:
  • Project: NT$100 for each point
  • Non-Project: NT$300 for each point

Preparation of specimens

  • Specimens size: 3mm in diameter and thinned
  • Stability of the specimens: specimens that have been processed by chemical or physical methods and are capable of withstanding electron beam irradiation
  • Polymer and organic samples: You must provide relevant stability test reports such as the chemical structure of the material, thermal cracking temperature, melting point, liquid crystal transition temperature, glass transition temperature, etc. to the technician or the professor responsible for the instrument, for preliminary review of the analysis feasibility of test piece under electron microscope
  • Biological samples: You must first discuss and explain the fixation method and stability of the test piece with the technician or the professor in charge of the instrument
  • Samples and magnetic materials that will decompose and release gas when the test piece is irradiated by electron beams will not be accepted

Contact Detail

Instrument expert: Prof. Shiao-Wei Kuo
Technical staff: Hsien-Tsan Lin
contact method: (07)5252000 ext. 4092 alex1002@mail.nsysu.edu.tw
Place: Materials Building 2F, Room MS2012
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