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Atomic Force Microscopy

Equipment 1: High Resolution Probe Microscope

Equipment Description

  • SPM (Brand: Digital Instrument, Model: NanoMan NS4+D3100)

Instrument Function Description

  • Measurement and analysis of material surface morphology and physical properties
  • Maximum scanning area:20×20×6 um
  • Maximum horizontal resolution:Å LEVEL
  • Maximum vertical resolution:0.1Å

Service Items

  • Measure the nanoscale surface topography of the sample
  • Measuring the distribution of surface friction of the sample
  • Measure the magnetic distribution on the surface of the sample
  • Measure the distribution map of the surface conductivity of the sample
  • Measure the surface potential energy properties of the sample
  • Measure the distribution of Phase on the surface of the sample
  • Distribution map of measured sample surface adhesion force
  • Measuring the chemical force distribution map on the surface of the sample
  • Measuring the distribution of tunneling current on the surface of the sample
  • Measuring the mechanical quality of materials such as sample hardness
  • Both Contact mode and Tapping mode can operate under open or closed liquid
  • Carve or grow different nanometer-scale patterns on the surface of materials by applying force and current

Sample Size

  • Diameter 200mm, thickness 12mm

Charge

  1.  Entrusted operation:
    • Project: NT$900/hour
    • Non-project: NT$3,500/hour
  2.  Self-operation:NT$500/hour

Contact Detail

Advisor: Department of Physics, Prof. Hsiung Chou

TEL:(07)5252000 ext. 3722

助理:Lu-Tang, Chen

TEL: 0939573815

Location: International building B1 IR0001 Lab

 

 

Equipment 2: Variable Temperature Probe Microscope

Equipment Description

  • SPM (Brand: Seiko, Model: HV-300)

Instrument Function Description

  • Measurement and analysis of material surface morphology and physical properties
  • Maximum scanning area:20×20μm
  • Maximum direction finding resolution:0.3nm
  • Maximum vertical resolution:0.01nm
  • Vacuum degree:Atmospheric~10-7 Torr
  • X-Y Stage movement:±6mm
  • Temperature control:-120℃~+800℃ (measure under 300℃)

Service Items

  • Measure the nanoscale surface topography of the sample
  • Measuring the distribution of surface friction of the sample
  • Measure the magnetic distribution on the surface of the sample
  • Measure the distribution map of the surface conductivity of the sample
  • Measure the distribution of Phase on the surface of the sample
  • Measure the surface potential energy properties of the sample
  • Measuring the distribution of tunneling current on the surface of the sample
  • Measure the lateral force distribution on the surface of the sample
  • Distribution map of measured sample surface adhesion force
  • Carve or grow different nanometer-scale patterns on the surface of materials by applying force and current
  • The above functions can be measured in the temperature range of -120℃ ~ 300℃ and the vacuum can reach 1×10-6 Torr

Sample Size

  • Maximum 25mmΦ×5mm (measured at room temperature), 10mm×10mm×3mm (temperature control)

Charge

Only entrusted operations are provided

  • Project: NT$900/hour
  • Non-Project: NT$4,500/hour
  • Consumables fee: NT$500/hour

Contact Detail

Instrument expert: Prof. Hsiung Chou
Technical staff: Ya-Tung Tsai
contact method: (07)5252000 ext. 3722 discover2900@gmail.com
Place: Physics Building 7F, Room PH7007
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