Atomic Force Microscopy
Equipment 1: High Resolution Probe Microscope

Equipment Description
- SPM (Brand: Digital Instrument, Model: NanoMan NS4+D3100)
Instrument Function Description
- Measurement and analysis of material surface morphology and physical properties
- Maximum scanning area:20×20×6 um
- Maximum horizontal resolution:Å LEVEL
- Maximum vertical resolution:0.1Å
Service Items
- Measure the nanoscale surface topography of the sample
- Measuring the distribution of surface friction of the sample
- Measure the magnetic distribution on the surface of the sample
- Measure the distribution map of the surface conductivity of the sample
- Measure the surface potential energy properties of the sample
- Measure the distribution of Phase on the surface of the sample
- Distribution map of measured sample surface adhesion force
- Measuring the chemical force distribution map on the surface of the sample
- Measuring the distribution of tunneling current on the surface of the sample
- Measuring the mechanical quality of materials such as sample hardness
- Both Contact mode and Tapping mode can operate under open or closed liquid
- Carve or grow different nanometer-scale patterns on the surface of materials by applying force and current
Sample Size
- Diameter 200mm, thickness 12mm
Charge
- Entrusted operation:
- Project: NT$900/hour
- Non-project: NT$3,500/hour
- Self-operation:NT$500/hour
Contact Detail
Advisor: Department of Physics, Prof. Hsiung Chou
TEL:(07)5252000 ext. 3722
助理:Lu-Tang, Chen
TEL: 0939573815
Location: International building B1 IR0001 Lab
Equipment 2: Variable Temperature Probe Microscope

Equipment Description
- SPM (Brand: Seiko, Model: HV-300)
Instrument Function Description
- Measurement and analysis of material surface morphology and physical properties
- Maximum scanning area:20×20μm
- Maximum direction finding resolution:0.3nm
- Maximum vertical resolution:0.01nm
- Vacuum degree:Atmospheric~10-7 Torr
- X-Y Stage movement:±6mm
- Temperature control:-120℃~+800℃ (measure under 300℃)
Service Items
- Measure the nanoscale surface topography of the sample
- Measuring the distribution of surface friction of the sample
- Measure the magnetic distribution on the surface of the sample
- Measure the distribution map of the surface conductivity of the sample
- Measure the distribution of Phase on the surface of the sample
- Measure the surface potential energy properties of the sample
- Measuring the distribution of tunneling current on the surface of the sample
- Measure the lateral force distribution on the surface of the sample
- Distribution map of measured sample surface adhesion force
- Carve or grow different nanometer-scale patterns on the surface of materials by applying force and current
- The above functions can be measured in the temperature range of -120℃ ~ 300℃ and the vacuum can reach 1×10-6 Torr
Sample Size
- Maximum 25mmΦ×5mm (measured at room temperature), 10mm×10mm×3mm (temperature control)
Charge
Only entrusted operations are provided
- Project: NT$900/hour
- Non-Project: NT$4,500/hour
- Consumables fee: NT$500/hour
Contact Detail
Instrument expert:
Prof. Hsiung Chou
Technical staff:
Ya-Tung Tsai
contact method:
(07)5252000 ext. 3722 discover2900@gmail.com
Place:
Physics Building 7F, Room PH7007
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